An advanced drain current model for DGMOSFETs including self-heating effects

B. González, J. Roldán, A. Roldán, B. Iñíguez, A. Lázaro, A. Cerdeira
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引用次数: 2

Abstract

An advanced drain current model for symmetrical Double-Gate MOSFETs (DGMOSFETs), including short channel, velocity saturation and self-heating effects, is presented. The temperature dependence of the low-field mobility, saturation velocity and inversion charge is analyzed and accurately included in the model. Self-heating is considered through the thermal resistance of the device, which is estimated in two ways: from an equivalent thermal circuit and from numerical output characteristic curves, obtained with a commercial TCAD tool (Sentaurus by Synopsys), and fitted with a drain current model. The validity of the model is checked by comparing with simulation results, for the typical bias range used in integrated circuits.
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一种先进的dgmosfet漏极电流模型,包括自热效应
提出了一种先进的对称双栅mosfet (dgmosfet)漏极电流模型,该模型考虑了短通道、速度饱和和自热效应。分析了低场迁移率、饱和速度和反演电荷对温度的依赖关系,并将其准确地包含在模型中。通过器件的热阻来考虑自加热,热阻通过两种方式估计:从等效热电路和从用商用TCAD工具(Synopsys公司的Sentaurus)获得的数值输出特性曲线,并与漏极电流模型拟合。针对集成电路中使用的典型偏置范围,通过与仿真结果的比较,验证了模型的有效性。
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