D. Braunger, Th. Durr, D. Hariskos, C. Koble, T. Walter, N. Wieser, H. Schock
{"title":"Improved open circuit voltage in CuInS/sub 2/-based solar cells","authors":"D. Braunger, Th. Durr, D. Hariskos, C. Koble, T. Walter, N. Wieser, H. Schock","doi":"10.1109/PVSC.1996.564300","DOIUrl":null,"url":null,"abstract":"The conversion efficiency of thin film solar cells based on CuInS/sub 2/ (/spl eta/=12%) is mainly limited by a moderate open circuit voltage (/spl ap/720 mV). This limitation can be overcome by modifying the absorber/buffer interface leading to open circuit voltages exceeding 800 mV. The addition of ZnS to the CuInS/sub 2/ as well as adjusting the preparation conditions for the CdS-buffer leads to an increased V/sub oc/. The coevaporation of ZnS or CdS additives and diffusion from precursor layers for two types of fabrication processes has been examined: codeposition of the elements and diffusion of Cu and S into In/sub x/S/sub y/ layers. The addition of ZnS leads to Zn-rich segregations on the CuInS/sub 2/ surface. No shift of the bandgap due to the Zn incorporation could be measured. Additionally, an improved sulfur incorporation using the binary In/sub 2/S/sub 3/ as the In and S source was found.","PeriodicalId":410394,"journal":{"name":"Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996","volume":"109 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.1996.564300","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
The conversion efficiency of thin film solar cells based on CuInS/sub 2/ (/spl eta/=12%) is mainly limited by a moderate open circuit voltage (/spl ap/720 mV). This limitation can be overcome by modifying the absorber/buffer interface leading to open circuit voltages exceeding 800 mV. The addition of ZnS to the CuInS/sub 2/ as well as adjusting the preparation conditions for the CdS-buffer leads to an increased V/sub oc/. The coevaporation of ZnS or CdS additives and diffusion from precursor layers for two types of fabrication processes has been examined: codeposition of the elements and diffusion of Cu and S into In/sub x/S/sub y/ layers. The addition of ZnS leads to Zn-rich segregations on the CuInS/sub 2/ surface. No shift of the bandgap due to the Zn incorporation could be measured. Additionally, an improved sulfur incorporation using the binary In/sub 2/S/sub 3/ as the In and S source was found.