DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE

K. Zolnikov, I. Strukov, K. Chubur, S. Grechanyy, A. Yagodkin, E. Grosheva
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Abstract

This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.
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开发用于评估辐射抗性的微芯片参数监测方法
在没有测试测量设备的情况下,本文讨论了监测专用ECB性能的技术手段,该ECB用于抗辐射的实验评估,该测试测量设备允许您控制暴露于电离辐射和外太空重带电粒子时最退化的退化区域。
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CURRENT STATE OF THE SPACE ELEMENT BASE DEVELOPMENT OF A CIRCUITRY AND CONSTRUCTIVE-TECHNOLOGICAL BASIS FOR COSMIC CHIPS DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE METHOD OF RECORDING A SIGNAL BY AN ELECTROENCEPHALOGRAPH FROM THE CEREBRAL CORTEX METHODS OF DESIGNING AN ELECTROENCEPHALOGRAPH FOR TAKING IMPULSES FROM THE CEREBRAL CORTEX
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