ECC management with rate compatible LDPC code for NAND flash storage: work-in-progress

Jae-Bin Lee, Geon-Myeong Kim, Seungho Lim
{"title":"ECC management with rate compatible LDPC code for NAND flash storage: work-in-progress","authors":"Jae-Bin Lee, Geon-Myeong Kim, Seungho Lim","doi":"10.1145/3349569.3351535","DOIUrl":null,"url":null,"abstract":"The NAND flash memory has rapidly increased in storage capacity per unit area, and the rate of occurrence of errors per P/E cycle is also rapidly increasing accordingly. ECC modules such as LDPC have been added to flash controller for recovering from the errors. However, the system designs to increase the lifetime of the flash memory storage device are still in great demand. In this paper, we design the LDPC encoding and decoding scheme to get stepwise code rate according to the P/E cycle by applying rate-compatible LDPC, as well as the management scheme of excessive parity data. Through this, we can improve the error recovery rate of flash memory storage system and extend the lifetime of NAND flash storage system while reducing the system read and write overhead due to the increase in additional parity data.","PeriodicalId":306252,"journal":{"name":"Proceedings of the International Conference on Compliers, Architectures and Synthesis for Embedded Systems Companion","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Compliers, Architectures and Synthesis for Embedded Systems Companion","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3349569.3351535","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The NAND flash memory has rapidly increased in storage capacity per unit area, and the rate of occurrence of errors per P/E cycle is also rapidly increasing accordingly. ECC modules such as LDPC have been added to flash controller for recovering from the errors. However, the system designs to increase the lifetime of the flash memory storage device are still in great demand. In this paper, we design the LDPC encoding and decoding scheme to get stepwise code rate according to the P/E cycle by applying rate-compatible LDPC, as well as the management scheme of excessive parity data. Through this, we can improve the error recovery rate of flash memory storage system and extend the lifetime of NAND flash storage system while reducing the system read and write overhead due to the increase in additional parity data.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
用于NAND闪存存储的具有速率兼容LDPC代码的ECC管理:正在进行中
随着NAND闪存单位面积存储容量的迅速增加,每P/E周期的出错率也在迅速增加。flash控制器中增加了LDPC等ECC模块,用于错误恢复。然而,提高闪存存储设备寿命的系统设计仍有很大的需求。本文采用兼容码率的LDPC设计了LDPC编解码方案,根据P/E周期逐步得到码率,并设计了过多奇偶数据的管理方案。通过这种方法,可以提高闪存存储系统的错误恢复率,延长NAND闪存存储系统的使用寿命,同时减少由于额外奇偶校验数据的增加而造成的系统读写开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Fine-grained acceleration using runtime integrated custom execution (RICE): work-in-progress ECC management with rate compatible LDPC code for NAND flash storage: work-in-progress Porting new versatile video coding transforms to a heterogeneous GPU-based technology: work-in-progress Automatic generation of application-specific FPGA overlays: work-in-progress Sequence-crafter: side-channel entropy minimization to thwart timing-based side-channel attacks: work-in-progress
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1