{"title":"Selectable-finesse fabry-perot interferometer for the frequency measurements of millimeter and submillimeter waves","authors":"T. Hori, T. Matsui, K. Araki, H. Inomata","doi":"10.1109/IRMM.1987.9127022","DOIUrl":null,"url":null,"abstract":"A scanning Fabry-Perot interferometer with selectable reflection-finesse is proposed for wide range operation over millimeter and submillimeter waves. The stripe directions of the two striped polarizing reflectors are made slightly different and the reflectance is varied according to the relative angle of two stripe directions. The optimization of reflection-finesse for frequency measurements is achieved by adjusting the relative angle. The experimental results show the possibility of selecting reflection-finesse over wide frequency range without exchanging reflectors.","PeriodicalId":399243,"journal":{"name":"1987 Twelth International Conference on Infrared and Millimeter Waves","volume":"108 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1987 Twelth International Conference on Infrared and Millimeter Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMM.1987.9127022","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A scanning Fabry-Perot interferometer with selectable reflection-finesse is proposed for wide range operation over millimeter and submillimeter waves. The stripe directions of the two striped polarizing reflectors are made slightly different and the reflectance is varied according to the relative angle of two stripe directions. The optimization of reflection-finesse for frequency measurements is achieved by adjusting the relative angle. The experimental results show the possibility of selecting reflection-finesse over wide frequency range without exchanging reflectors.
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