Compaction-based test generation using state and fault information

Abstract

Presents a new test generation procedure for sequential circuits using newly-traversed state information and newly-detected fault information obtained between successive iterations of vector compaction. Two types of technique are considered. One is based on which new states a sequential circuit is driven into, and the other is based on the new faults that are detected in the circuit between consecutive iterations of vector compaction. These data modify an otherwise random selection of vectors to bias vector sequences that cause the circuit to reach new states and cause previously undetected faults to be detected. The biased vectors, when used to extend the compacted test set, provide an intelligent selection of vectors. The extended test set is then compacted. Repeated applications of state and fault analysis, vector generation and compaction produce significantly high fault coverage using relatively small computing resources. We obtained improvements in terms of higher fault coverage, fewer vectors for the same coverage, or smaller numbers of iterations and time required, consistently for several benchmark circuits.