A unified DFT architecture for use with IEEE 1149.1 and VSIA/IEEE P1500 compliant test access controllers

B. Dervisoglu
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引用次数: 15

Abstract

This paper discusses some of the critical issues that may prevent IEEE P1500 from becoming an acceptable standard and offers some suggestions for their solution. In particular, the inadequacy of the proposed P1500 and the VSIA solutions in handling hierarchical implementations is addressed. Support for hierarchical implementations is seen as an essential feature in a test access methodology that is intended for use in System on a Chip (SoC) designs. The author is actively pursuing some of these solutions through the working groups.
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用于IEEE 1149.1和VSIA/IEEE P1500兼容的测试访问控制器的统一DFT体系结构
本文讨论了可能阻碍IEEE P1500成为可接受标准的一些关键问题,并为解决这些问题提供了一些建议。特别地,提出了P1500和VSIA解决方案在处理分层实现方面的不足之处。对分层实现的支持被视为测试访问方法的基本特征,旨在用于片上系统(SoC)设计。作者正在通过工作组积极地寻求其中的一些解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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