Chan-Hui Jeong, Kyu-Young Kim, Chan-Keun Kwon, H. Kim, Soo-Won Kim
{"title":"Digital calibration technique using a signed counter for charge pump mismatch in phase-locked loops","authors":"Chan-Hui Jeong, Kyu-Young Kim, Chan-Keun Kwon, H. Kim, Soo-Won Kim","doi":"10.1049/iet-cds.2013.0011","DOIUrl":null,"url":null,"abstract":"The authors adopt a digital technique to calibrate the current mismatch of the charge pump in phase-locked loops. The proposed digital calibration technique using a signed counter reduces the calibration time up to a minimum of 64% as compared with the other techniques. This technique is designed by a standard 0.18 μm CMOS technology. The calibration time is 32.8 μs, the average power is 6.2 mW at a 1.8 V power supply and the effective area is 0.263 mm 2 .","PeriodicalId":120076,"journal":{"name":"IET Circuits Devices Syst.","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IET Circuits Devices Syst.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/iet-cds.2013.0011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
The authors adopt a digital technique to calibrate the current mismatch of the charge pump in phase-locked loops. The proposed digital calibration technique using a signed counter reduces the calibration time up to a minimum of 64% as compared with the other techniques. This technique is designed by a standard 0.18 μm CMOS technology. The calibration time is 32.8 μs, the average power is 6.2 mW at a 1.8 V power supply and the effective area is 0.263 mm 2 .