Transmission line pulse test methods, test techniques and characterization of low capacitance voltage suppression device for system level electrostatic discharge compliance

Abstract

Voltage suppression devices are needed in electronic systems to prevent damage to electrical components from electrical overstress (EOS) and electrostatic discharge (ESD) events. A low capacitance, polymer voltage-suppressor (PVS) device is evaluated using various testing techniques that combine transmission line pulse (TLP) test system, direct discharge HBM, and a system-level ESD gun. Additionally, test methods for integrating PVS devices for system-level ESD protection of cell phone GaAs radio frequency (RF) switches and Gigabit Ethernet server semiconductors will be shown. Our work demonstrates the need for integration of device-level and system-level test methodologies for correlation between component ESD survivability and system-level ESD concerns.