Availability analysis of electronic flight instrument system based on dynamic fault tree

Abstract

As a high availability product, Electronic Flight Instrument System (EFIS) has very complicated redundancy structures to fulfill high safety integrity requirement. This paper presents a comprehensive study on the availability analysis for EFIS by using Dynamic Fault Tree (DFT) approach based on Markov chain with modularization method. The static fault sub-tree is solved by Binary Decision Diagram (BDD) and the dynamic fault sub-tree is solved by Markov chain. A novel Markov chain expression is utilized to avoid state explosion of dynamic fault sub-tree. Besides, Minimal Cut Sequence Set (MCSS) are generated. At last, Monte Carlo simulation is carried out to verify the theoretical results.