{"title":"A systematic approach to the test of combined HW/SW systems","authors":"A. Krupp, W. Müller","doi":"10.1109/DATE.2010.5457186","DOIUrl":null,"url":null,"abstract":"Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition.","PeriodicalId":432902,"journal":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DATE.2010.5457186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
