{"title":"SCOAP: Sandia Controllability/Observability Analysis Program","authors":"Lawrence H. Goldstein, E. L. Thigpen","doi":"10.1145/62882.62929","DOIUrl":null,"url":null,"abstract":"SCOAP is a program developed at Sandia National Laboratories for the analysis of digital circuit testability. Testability is related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper reviews the testability analysis algorithms and describes their implementation in the SCOAP program.","PeriodicalId":196513,"journal":{"name":"17th Design Automation Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"146","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"17th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/62882.62929","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 146
Abstract
SCOAP is a program developed at Sandia National Laboratories for the analysis of digital circuit testability. Testability is related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper reviews the testability analysis algorithms and describes their implementation in the SCOAP program.
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