A Simulation Study of Interface Traps Effects of Magnetic Sensitivity in Sectorial SD-MAGFET

Zhenyi Yang, Lining Zhang, P. Lai
{"title":"A Simulation Study of Interface Traps Effects of Magnetic Sensitivity in Sectorial SD-MAGFET","authors":"Zhenyi Yang, Lining Zhang, P. Lai","doi":"10.1109/iccss55260.2022.9802172","DOIUrl":null,"url":null,"abstract":"This paper investigates the impact of Si/SiO2 interface traps on the boundary of a sectorial SD-MAGFET in detail. Ionized acceptor traps act like negative oxide charges, depleting the device’s conduction channel, whereas ionized donor traps act like positive oxide charges, weakening the magnetic sensing by inducing a parasitic channel at the boundary. The larger the influence on magnetic sensitivity, in particular, the higher the density of acceptor or donor traps. Furthermore, trap energy also has an influence on sensitivity, with larger effect for traps lying closer to the valence or conduction band. The impacts of interface traps were numerically simulated using the TCAD simulator - Silvaco Atlas.","PeriodicalId":254992,"journal":{"name":"2022 5th International Conference on Circuits, Systems and Simulation (ICCSS)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 5th International Conference on Circuits, Systems and Simulation (ICCSS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/iccss55260.2022.9802172","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper investigates the impact of Si/SiO2 interface traps on the boundary of a sectorial SD-MAGFET in detail. Ionized acceptor traps act like negative oxide charges, depleting the device’s conduction channel, whereas ionized donor traps act like positive oxide charges, weakening the magnetic sensing by inducing a parasitic channel at the boundary. The larger the influence on magnetic sensitivity, in particular, the higher the density of acceptor or donor traps. Furthermore, trap energy also has an influence on sensitivity, with larger effect for traps lying closer to the valence or conduction band. The impacts of interface traps were numerically simulated using the TCAD simulator - Silvaco Atlas.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
扇形SD-MAGFET中界面陷阱对磁灵敏度影响的仿真研究
本文详细研究了Si/SiO2界面陷阱对扇形SD-MAGFET边界的影响。电离的受体陷阱就像负的氧化物电荷,耗尽设备的传导通道,而电离的供体陷阱就像正的氧化物电荷,通过在边界诱导寄生通道削弱磁传感。对磁灵敏度的影响越大,特别是,受体或供体陷阱的密度越高。此外,陷阱能量对灵敏度也有影响,靠近价带或导带的陷阱影响更大。利用TCAD模拟器Silvaco Atlas对界面陷阱的影响进行了数值模拟。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Coordination and Optimization of Virtual Power Plant Based on Multi-agent System Thermal-Aware IC Chip Design by Combining High Thermal Conductivity Materials and GAA MOSFET A Novel Compact LC-Based Balun Combiner with 2nd and 3rd Harmonic Suppression A High Linearity and Low Load Regulation LDO with SATEC and TIR Compensation Design and Implementation of Intelligent-pharmaceutical-delivery-system Based on Loongson 1B
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1