{"title":"The 3D modeling and SI/PI co-sim analysis for mixed-referenced high speed GDDR5","authors":"Y. H. Sun, X. Qi, A. Z. Ramírez","doi":"10.1109/ICCDCS.2012.6188934","DOIUrl":null,"url":null,"abstract":"In this paper, a methodology for combined simulation (co-sim) of power and signal to ensure a proper signal-to-power-ground ratio in vertical connections is presented. Capturing the vertical return current, power-to-signal, and signal-to-signal crosstalk simultaneously and accurately requires the modeling of the entire memory channel using 3D tools. Combined simulations allow a highly sensitive analysis in the design of vertical return path such as plated-through-hole (PTH) and ball grid array (BGA) connections. Proposed co-sim methodology is demonstrated with GDDR5 memory channel simulations based on two validation boards with a throughput-computing, high-performance processor. As a result of the analysis, design guidelines and recommendations were defined.","PeriodicalId":125743,"journal":{"name":"2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2012.6188934","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, a methodology for combined simulation (co-sim) of power and signal to ensure a proper signal-to-power-ground ratio in vertical connections is presented. Capturing the vertical return current, power-to-signal, and signal-to-signal crosstalk simultaneously and accurately requires the modeling of the entire memory channel using 3D tools. Combined simulations allow a highly sensitive analysis in the design of vertical return path such as plated-through-hole (PTH) and ball grid array (BGA) connections. Proposed co-sim methodology is demonstrated with GDDR5 memory channel simulations based on two validation boards with a throughput-computing, high-performance processor. As a result of the analysis, design guidelines and recommendations were defined.