Kinetic Analysis of the VLS Growth of Semiconducting Nanowires

D. Shakthivel, Adamos Christou, R. Dahiya
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引用次数: 1

Abstract

Vapour-Liquid-Solid (VLS) growth mechanism is a popular method for the growth of inorganic semiconducting nanowires (NWs) in the diameter range of sub-100 nm. A kinetic model is presented for the growth of elemental (Si) and binary $(SiO_{\mathrm{x}})$ NWs by incorporating all the atomistic parameters. Importantly, the model connects the macroscopic experimental parameters such as temperature, pressure and catalyst particle with atomistic aspects such as supersaturation, energy barriers and interface diffusivity. The thermodynamic driving force for the NWs growth is estimated by balancing various injection-ejection processes occurring at the catalyst droplet. Using the kinetic framework, the steady state Si concentration in the Au-Si droplet is estimated for the catalyst diameter in the range of 10-100nm. The calculated NWs growth rates were observed to be within an order of magnitude in comparision with the experimentally measured values.
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半导体纳米线VLS生长的动力学分析
气-液-固(VLS)生长机制是制备直径在100 nm以下的无机半导体纳米线的常用方法。通过综合所有原子参数,提出了单质(Si)和二元$(SiO_{\ mathm {x}})$ NWs生长的动力学模型。重要的是,该模型将宏观实验参数(如温度、压力和催化剂颗粒)与原子方面(如过饱和、能垒和界面扩散率)联系起来。通过平衡发生在催化剂液滴上的各种注入-喷射过程来估计NWs生长的热力学驱动力。利用动力学框架,估计了催化剂直径在10 ~ 100nm范围内的Au-Si液滴中Si的稳态浓度。与实验测量值相比,计算得到的NWs生长率在一个数量级以内。
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