Molecular Dynamics Simulation on Deformation Mechanism of Chemical Mechanical Polishing

Tan-Tai Do, T. Fang, T. Cheng
{"title":"Molecular Dynamics Simulation on Deformation Mechanism of Chemical Mechanical Polishing","authors":"Tan-Tai Do, T. Fang, T. Cheng","doi":"10.1109/ICASI57738.2023.10179507","DOIUrl":null,"url":null,"abstract":"This study uses molecular dynamics (MD) simulation to examine how the sliding movement of a polishing tool affects the polishing properties of a Carbon-doped Boron Nitride substrate by discussing the effects of various polishing levels. The findings demonstrate how depth influences the amount of deleted atoms and severely extended asperity. The tool provides the most force at a depth of 6Å, whereas the polishing depth of 2Å produces the lowest polishing force. Hence, as polishing depth increases, the friction coefficient also increases. Moreover, the amount of deleted atoms and the extended asperity section increase with increased polishing depth while the asperity height decreases. Interestingly, this model also accurately depicts the behaviors of the material removal mechanism and the topography of the sample of the deleted atom chains after polishing.","PeriodicalId":281254,"journal":{"name":"2023 9th International Conference on Applied System Innovation (ICASI)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 9th International Conference on Applied System Innovation (ICASI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICASI57738.2023.10179507","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This study uses molecular dynamics (MD) simulation to examine how the sliding movement of a polishing tool affects the polishing properties of a Carbon-doped Boron Nitride substrate by discussing the effects of various polishing levels. The findings demonstrate how depth influences the amount of deleted atoms and severely extended asperity. The tool provides the most force at a depth of 6Å, whereas the polishing depth of 2Å produces the lowest polishing force. Hence, as polishing depth increases, the friction coefficient also increases. Moreover, the amount of deleted atoms and the extended asperity section increase with increased polishing depth while the asperity height decreases. Interestingly, this model also accurately depicts the behaviors of the material removal mechanism and the topography of the sample of the deleted atom chains after polishing.
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化学机械抛光变形机理的分子动力学模拟
本研究利用分子动力学(MD)模拟研究了抛光工具的滑动运动如何影响碳掺杂氮化硼衬底的抛光性能,讨论了不同抛光水平的影响。研究结果表明,深度如何影响删除原子的数量和严重扩展的粗糙度。该工具在6Å深度提供最大的力,而2Å的抛光深度产生最低的抛光力。因此,随着抛光深度的增加,摩擦系数也随之增加。随着抛光深度的增加,去除原子的数量和延伸的粗糙截面增加,而粗糙高度减小。有趣的是,该模型还准确地描述了材料去除机制的行为和抛光后缺失原子链样品的形貌。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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