{"title":"Intelligent computer based training","authors":"M. Ben-Bassat, I. Beniaminy, D. Joseph","doi":"10.1109/AUTEST.1997.633568","DOIUrl":null,"url":null,"abstract":"Increasingly complex test equipment, complex technologies, growing pressure on technicians' and engineers' performance, and the need for integrated knowledge during the problem-resolution process, are all demanding a higher level of expertise and a new approach to training.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1997.633568","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Increasingly complex test equipment, complex technologies, growing pressure on technicians' and engineers' performance, and the need for integrated knowledge during the problem-resolution process, are all demanding a higher level of expertise and a new approach to training.
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