Impact of test compression on power supply noise control

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) Pub Date : 2015-10-01 DOI:10.1109/DFT.2015.7315155

Tengteng Zhang, D. Walker

引用次数: 0

Abstract

Compaction and compression are commonly used to minimize test data volume and test application time. Both techniques can greatly affect power supply noise (PSN) during test, as these techniques take advantage of the fact that test patterns have low care-bit density. However, there is little prior work studying how compression affects PSN. In this work, embedded deterministic test (EDT) and Illinois Scan patterns are generated with and without compaction. Our previous PSN control algorithm is extended to incorporate the compression constraints and applied to these patterns. The experimental results show that with the PSN control algorithm, EDT lowers the maximal PSN by 24.15% and Illinois Scan lowers it by 2.77% on un-compacted patterns. The maximal PSN is 22.32% and 6.94% lower on compacted patterns.

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试验压缩对电源噪声控制的影响

压缩和压缩通常用于最小化测试数据量和测试应用时间。这两种技术都可以极大地影响测试期间的电源噪声(PSN)，因为这些技术利用了测试模式具有低护理位密度的事实。然而，之前很少有研究压缩如何影响PSN的工作。在这项工作中，嵌入式确定性测试(EDT)和伊利诺伊扫描模式生成与不压缩。我们之前的PSN控制算法被扩展到包含压缩约束并应用于这些模式。实验结果表明，采用该控制算法，在非压缩模式下，EDT使最大PSN降低24.15%，伊利诺伊扫描使最大PSN降低2.77%。压缩模式下最大PSN降低22.32%，压缩模式下最大PSN降低6.94%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

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