The impact of liquid cooling on 3D multi-core processors

H. Jang, I. Yoon, C. Kim, Seungwon Shin, S. Chung
{"title":"The impact of liquid cooling on 3D multi-core processors","authors":"H. Jang, I. Yoon, C. Kim, Seungwon Shin, S. Chung","doi":"10.1109/ICCD.2009.5413115","DOIUrl":null,"url":null,"abstract":"Recently, 3D integration has been regarded as one of the most promising techniques due to its abilities of reducing global wire lengths and lowering power consumption. However, 3D integrated processors inevitably cause higher power density and lower thermal conductivity, since the closer proximity of heat generating dies makes existing thermal hotspots more severe. Without an efficient cooling method inside the package, 3D integrated processors should suffer severe performance degradation by dynamic thermal management as well as reliability problems. In this paper, we analyze the impact of the liquid cooling on a 3D multi-core processor compared to the conventional air cooling. We also evaluate the leakage power consumption and the lifetime reliability depending on the temperature of each functional unit in the 3D multi-core processor. The simulation results show that the liquid cooling reduces the temperature of the L1 instruction cache (the hottest block in this evaluation) by as much as 45 degrees, resulting in 12.8% leakage reduction, on average, compared to the conventional air cooling. Moreover, the reduced temperature of the L1 instruction cache also improves the reliability of electromigration, stress migration, time-dependent dielectric breakdown, thermal cycling, and negative bias temperature instability significantly.","PeriodicalId":256908,"journal":{"name":"2009 IEEE International Conference on Computer Design","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"34","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International Conference on Computer Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2009.5413115","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 34

Abstract

Recently, 3D integration has been regarded as one of the most promising techniques due to its abilities of reducing global wire lengths and lowering power consumption. However, 3D integrated processors inevitably cause higher power density and lower thermal conductivity, since the closer proximity of heat generating dies makes existing thermal hotspots more severe. Without an efficient cooling method inside the package, 3D integrated processors should suffer severe performance degradation by dynamic thermal management as well as reliability problems. In this paper, we analyze the impact of the liquid cooling on a 3D multi-core processor compared to the conventional air cooling. We also evaluate the leakage power consumption and the lifetime reliability depending on the temperature of each functional unit in the 3D multi-core processor. The simulation results show that the liquid cooling reduces the temperature of the L1 instruction cache (the hottest block in this evaluation) by as much as 45 degrees, resulting in 12.8% leakage reduction, on average, compared to the conventional air cooling. Moreover, the reduced temperature of the L1 instruction cache also improves the reliability of electromigration, stress migration, time-dependent dielectric breakdown, thermal cycling, and negative bias temperature instability significantly.
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液体冷却对3D多核处理器的影响
最近,3D集成被认为是最有前途的技术之一,因为它能够缩短总线长度和降低功耗。然而,3D集成处理器不可避免地会导致更高的功率密度和更低的导热系数,因为产热模具的距离更近,使现有的热热点更加严重。如果封装内部没有有效的冷却方法,3D集成处理器将因动态热管理和可靠性问题而遭受严重的性能下降。在本文中,我们分析了液体冷却对三维多核处理器的影响,并与传统的空气冷却进行了比较。我们还评估了泄漏功耗和寿命可靠性取决于三维多核处理器中每个功能单元的温度。仿真结果表明,与传统的空气冷却相比,液体冷却使L1指令缓存(本次评估中最热的块)的温度降低了45度,平均减少了12.8%的泄漏。此外,L1指令缓存温度的降低也显著提高了电迁移、应力迁移、时变介电击穿、热循环和负偏置温度不稳定性的可靠性。
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