{"title":"VR noise analysis and reduction in printed circuit board designs","authors":"Yinglei Ren, Wei Shen, Kai Xiao","doi":"10.1109/ISEMC.2014.6899000","DOIUrl":null,"url":null,"abstract":"Noise caused by switching voltage regulator (VR noise) can have a big impact on system signal / power performance, leading to signal integrity (SI) / power integrity (PI) issues. This paper introduces systematic ways of reducing VR noise as well as VR noise analysis methods. And a real design case with VR noise issue is shared with simulation and measurement results.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2014.6899000","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Noise caused by switching voltage regulator (VR noise) can have a big impact on system signal / power performance, leading to signal integrity (SI) / power integrity (PI) issues. This paper introduces systematic ways of reducing VR noise as well as VR noise analysis methods. And a real design case with VR noise issue is shared with simulation and measurement results.
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