Evaluating the Level of Electromagnetic Interference Generated by the ESD Source in the TEM-Cell

Drozdova Anastasiya, Komnatnov Maxim
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Abstract

We evaluated the induced electromagnetic interference (EMI) on a monopole and a microstrip line (MSL) generated by an electrostatic discharge (ESD) source in a small-sized TEM-cell. Analytical, quasi-static, and electrodynamic models are presented for calculating the waveforms and amplitudes of currents and voltages induced on the monopole and the MSL. These waveforms are presented for analytical, quasi-static, electrodynamic calculations, and measurements. The maximum deviations of analytical and electrodynamic calculations results for the monopole and the MSL are 25% and 9%. An approach is presented for using half of the coaxial chamber as a matching device between the ESD source and the TEM-cell. The results of calculations and measurements agree well, which indicates the possibility of using a small-sized TEM-cell and half of the coaxial chamber. These devices could be helpful to study the effect of ESD-generated EMI on integrated circuits (IC), electronic component base, and small devices in general.
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TEM-Cell中ESD源产生的电磁干扰水平评估
在小型tem电池中,我们评估了静电放电源对单极子和微带线产生的感应电磁干扰(EMI)。给出了分析模型、准静态模型和电动力学模型来计算感应在单极子和MSL上的电流和电压的波形和幅值。这些波形提出了分析,准静态,电动态计算和测量。单极子和MSL的解析计算结果和电动力学计算结果的最大偏差分别为25%和9%。提出了一种利用半同轴腔作为ESD源和tem单元之间的匹配装置的方法。计算结果与实测结果吻合较好,表明采用小尺寸的TEM-cell和半同轴腔是可行的。这些装置可以帮助研究静电产生的电磁干扰对集成电路(IC)、电子元件底座和一般小型器件的影响。
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