Load/unload processes for sub-5-nm flying height sliders

Abstract

The load/unload (L/UL) processes of relatively high flying height (FH) sliders have been studied extensively. The pitch static attitude (PSA), roll static attitude (RSA), L/UL velocities, disk RPM, suspension limiter, and slider air-bearing surface (ABS) design are important factors that can affect the L/UL performance significantly. It is inevitable that sliders are required to fly below 5 nm with the rapid increase in areal density. At such a low FH, it is a big challenge to L/UL a slider safely. However, L/UL process and slider design strategy for a safe L/UL of ultra-low FH sliders are seldom studied so far. In this paper, the effects of vertical L/UL velocities, disk RPM, PSA and RSA gram load, slider crown/camber and mask shifting in the slider manufacturing process on the L/UL performance of a sub-5-nm FH slider are studied. Then, a design guideline for better L/UL performance is proposed and its effectiveness is verified.