Snapshot imaging Mueller matrix instrument

Abstract

A novel way to measure the Mueller matrix image enables a sample's diattenuation, retardance, and depolarization to be measured within a single camera integration period. Since the Mueller matrix components are modulated onto coincident carrier frequencies, the described technique provides unique solutions to image registration problems for moving objects. In this paper, a snapshot imaging Mueller matrix polarimeter is theoretically described, and preliminary results shows it to be a viable approach for use in surface characterization of moving objects.