{"title":"Simple method of determining the large-signal negative resistance of baritt diodes","authors":"S. Ahmad, J. Freyer, M. Claassen","doi":"10.1049/IJ-SSED:19770017","DOIUrl":null,"url":null,"abstract":"A new method is presented for the determination of the large-signal negative resistance of baritt diodes. The simplicity is emphasised in terms of the ususal current/voltage characteristic measurements required. The diodes can thus be characterised, under actual operation conditions, in a microwave circuit, with the help of the present method.","PeriodicalId":127114,"journal":{"name":"Iee Journal on Solidstate and Electron Devices","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1977-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iee Journal on Solidstate and Electron Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/IJ-SSED:19770017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A new method is presented for the determination of the large-signal negative resistance of baritt diodes. The simplicity is emphasised in terms of the ususal current/voltage characteristic measurements required. The diodes can thus be characterised, under actual operation conditions, in a microwave circuit, with the help of the present method.
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