{"title":"Test des circuits intégrés numériques - Conception orientée testabilité","authors":"Mounir Benabdenbi, R. Leveugle","doi":"10.51257/a-v2-e2461","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":335120,"journal":{"name":"Architecture et tests des circuits numériques","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Architecture et tests des circuits numériques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.51257/a-v2-e2461","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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