Design of a slow-control chip to interface and read out front-end detectors at SLHC

A. Gabrielli, G. de Robertis, F. Loddo, A. Ranieri
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Abstract

This work is aimed at defining the architecture of a new digital ASIC, namely Slow Control Architecture (SCA), which will be designed and fabricated in a commercial 130 nm CMOS technology. This chip will be embedded within a high-speed data acquisition optical link (GBT) to control and monitor the front-end electronics — post-processing electronics for front-end sensors - proposed for future high-energy physics experiments at the super-Large Hadron Collider (SLHC), CERN, Geneva. The GBT link provides a transparent transport layer between the SCA and control electronics in the counting room. It will be provided with rad-hard redundant logic for critical circuits. The project follows a set of designs that were recently developed via a 250 nm CMOS technology for LHC experiments. Since this 250 nm specific technology used to design ASICs for the LHC will no longer be available as it was in the past, requesting an update technology for future experiments must be satisfied in any case. A test chip that implements three different redundant methodologies against Single Event Effects is also described. The ongoing work is within the Italian DACEL2 collaboration.
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SLHC前端探测器接口和读出慢控芯片的设计
这项工作旨在定义一种新的数字专用集成电路的架构,即慢速控制架构(SCA),该架构将在商用130纳米CMOS技术上设计和制造。该芯片将嵌入高速数据采集光链路(GBT)中,以控制和监控前端电子设备——前端传感器的后处理电子设备——为未来在日内瓦欧洲核子研究中心的超大型强子对撞机(SLHC)进行的高能物理实验提出。GBT链路在SCA和点票室的控制电子设备之间提供了一个透明的传输层。它将为关键电路提供rad-hard冗余逻辑。该项目采用了最近通过250纳米CMOS技术为大型强子对撞机实验开发的一系列设计。由于用于设计大型强子对撞机专用集成电路的250纳米特定技术将不再像过去那样可用,因此无论如何都必须满足对未来实验的更新技术的要求。本文还描述了一种针对单事件效应实现三种不同冗余方法的测试芯片。正在进行的工作是在意大利DACEL2合作中进行的。
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