The influence of n-type silicon piezoresistors pre-strain state on their piezoresistance

V. Gridchin, A. S. Cherkaev, E. G. Sayanova
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引用次数: 2

Abstract

Theory of n-type silicon longitudinal and transverse piezoresistance coefficients in the case of uniaxial pre-strain state along [100] crystallographic axis is presented. Numerical calculations for various impurity concentrations in a range of 1·1016 - 1·1020 cm-3 are performed. It has been shown that compressive pre-strain state of the piezoresistor can increase the longitudinal piezoresistance coefficient on 60 %.
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n型硅压电阻预应变状态对其压电阻的影响
提出了沿[100]晶轴单轴预应变状态下n型硅的纵向和横向压阻系数理论。在1·1016 - 1·1020 cm-3范围内进行了各种杂质浓度的数值计算。结果表明,压敏电阻的压缩预应变状态可使纵向压阻系数提高60%以上。
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