Andrew Stern, Jason Vosatka, Shahin Tajik, Farimah Farahmandi, M. Tehranipoor
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引用次数: 0
Abstract
The root-of-trust in mission-critical systems originates with hardware. Evaluating each component for trust prior to installation is essential for modern electronic systems. We propose laser and emission-based microscopy to non-destructively assess integrated circuits with high confidence. We demonstrate this approach on a 28 nm device.
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