T. Hirao, T. Hashimoto, N. Shirai, Hiroki Arai, N. Matsuura, H. Matsuura
{"title":"Low reverse recovery charge 30-V power MOSFETs for DC-DC converters","authors":"T. Hirao, T. Hashimoto, N. Shirai, Hiroki Arai, N. Matsuura, H. Matsuura","doi":"10.1109/ISPSD.2013.6694456","DOIUrl":null,"url":null,"abstract":"Two low reverse recovery charge solutions for 30-V power MOSFETs are proposed. One solution is a device consisting of a MOSFET and a Schottky barrier diode (SBD) in a single chip featuring a double epi structure to enhance the breakdown voltage. The other solution is a device with an integrated SBD in every unit cell that can achieve a high threshold voltage via the P- layer with Schottky contact. Both proposed devices exhibited low reverse recovery currents in simulations. Moreover, the surge voltage of the first device which we fabricated reduced by 58%, which enables the use of a lower voltage device and a reduction of the device loss.","PeriodicalId":175520,"journal":{"name":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2013.6694456","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Two low reverse recovery charge solutions for 30-V power MOSFETs are proposed. One solution is a device consisting of a MOSFET and a Schottky barrier diode (SBD) in a single chip featuring a double epi structure to enhance the breakdown voltage. The other solution is a device with an integrated SBD in every unit cell that can achieve a high threshold voltage via the P- layer with Schottky contact. Both proposed devices exhibited low reverse recovery currents in simulations. Moreover, the surge voltage of the first device which we fabricated reduced by 58%, which enables the use of a lower voltage device and a reduction of the device loss.