A. Alaeldine, Jerome Cordi, R. Perdriau, M. Ramdani, J. Levant
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引用次数: 9
Abstract
This paper introduces complete simulation models of typical electromagnetic immunity tests for integrated circuits (ICs). Direct Power Injection (DPI), Near-field (NF) and Very- Fast Transmission Line Pulsing (VF-TLP) experiments are modeled accurately, and comparisons between simulations and measurements for each set-up demonstrate the validity of this approach and lead to the development of an immunity prediction method for ICs.
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