{"title":"Effects of switch failure on soft-configurable WSI yield","authors":"M. Blatt","doi":"10.1109/ICWSI.1990.63896","DOIUrl":null,"url":null,"abstract":"A fault tolerant switch network is evaluated, using a pipelined memory system as an example application. Monte Carlo simulation predicts the yield of each circuit piece directly from the layout. Circuit yields are combined with a system model to predict wafer yield. Previous work described system models based on site yield. System models requiring low latency are shown to also depend on switch yield.<<ETX>>","PeriodicalId":206140,"journal":{"name":"1990 Proceedings. International Conference on Wafer Scale Integration","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 Proceedings. International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1990.63896","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
A fault tolerant switch network is evaluated, using a pipelined memory system as an example application. Monte Carlo simulation predicts the yield of each circuit piece directly from the layout. Circuit yields are combined with a system model to predict wafer yield. Previous work described system models based on site yield. System models requiring low latency are shown to also depend on switch yield.<>
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