{"title":"User group implementation with a U.S. supplier","authors":"S. Hossain-Pas, J. Brennan, D. Matsuhiro","doi":"10.1109/ASMC.1996.558119","DOIUrl":null,"url":null,"abstract":"Tool productivity or Overall Equipment Effectiveness (OEE) is an important topic in the semiconductor industry. One strategy for increasing tool productivity involves increasing the reliability of the system. This task can be better accomplished when the factors affecting the reliability parameters are identified, corrected, and communicated. A User's Group allows all users to share data, issues, lessons learned, and best known methods which then provide the foundation for identifying and resolving barriers to productivity. Often, discussion and communication between the users and the supplier can provide an immediate basis for solutions. Further improvements will be made over time in a partnership between the supplier and the users.","PeriodicalId":325204,"journal":{"name":"IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1996.558119","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Tool productivity or Overall Equipment Effectiveness (OEE) is an important topic in the semiconductor industry. One strategy for increasing tool productivity involves increasing the reliability of the system. This task can be better accomplished when the factors affecting the reliability parameters are identified, corrected, and communicated. A User's Group allows all users to share data, issues, lessons learned, and best known methods which then provide the foundation for identifying and resolving barriers to productivity. Often, discussion and communication between the users and the supplier can provide an immediate basis for solutions. Further improvements will be made over time in a partnership between the supplier and the users.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
使用美国供应商的用户组实现
工具生产率或整体设备效率(OEE)是半导体行业的一个重要课题。提高刀具生产率的一个策略是提高系统的可靠性。当对影响可靠性参数的因素进行识别、纠正和沟通时,可以更好地完成这项任务。用户组允许所有用户共享数据、问题、经验教训和最知名的方法,从而为识别和解决生产力障碍提供基础。通常,用户和供应商之间的讨论和沟通可以为解决方案提供直接的基础。随着时间的推移,供应商和用户之间的伙伴关系将进一步改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Production use of an integrated automatic defect classification (ADC) system operating in a laser confocal/white light imaging defect review station Strategic alliances for equipment reliability improvement in a dynamic startup environment 16 M DRAM manufacturing cooperation IBM/SIEMENS in Corbeil Essonnes in France Semiconductor factory automation: designing for phased automation Yield risk cards at D2
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1