IBIST/sup TM/ (interconnect built-in self-test) architecture and methodology for pci express: intel's next-generation test and validation methodology for performance IO
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引用次数: 11
Abstract
This paper summarizes the test challenges associated with next -generation platform buses and introduces an Intel-developed technology called IBISTTM (Interconnect Built-In Self-Test) created to meet those challenges. The IBISTTM testing methodology and associated on-die architecture customized for PCI Express (PCIe) interface is described.
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