The relationship between laser fluence profile and the cumulative probability of damage curve

J. Arenberg
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引用次数: 4

Abstract

The Gaussian profile beam has been de rigeur for damage threshold measurements for decades. This paper formulates the cumulative probability of damage (CPD) curve for the Gaussian and an arbitrary distribution of defects in fluence (intensity) space. It is seen that the CPD for the Gaussian is relatively insensitive to the underlying distribution of defects. The CPD is reformulated for a flat top distribution and shown to be far more influenced by the underlying defect distribution. The paper concludes with a discussion of the relationship between the defect distribution, sample size, threshold and measured threshold, for both the Gaussian and flat top profiles. It will be shown than the CPD for Gaussian beams increases with increasing fluence regardless of the distributions of the defects in fluence. The Flat Top CPD will only increase with increasing defect density.
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激光能量流剖面与损伤曲线累积概率的关系
几十年来,高斯光束一直是损伤阈值测量的必要条件。本文给出了缺陷在影响(强度)空间中的高斯分布和任意分布的累积损伤概率(CPD)曲线。可以看出,高斯分布的CPD对缺陷的底层分布相对不敏感。CPD是为平顶分布而重新制定的,并且显示受潜在缺陷分布的影响要大得多。本文最后讨论了高斯型和平顶型缺陷分布、样本量、阈值和测量阈值之间的关系。结果表明,高斯光束的CPD随影响的增加而增加,而与影响中缺陷的分布无关。平顶CPD只会随着缺陷密度的增加而增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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