Fault Detection Technique for SMGF and Appearance Faults in Reversible Circuits using Matrix Model

Abstract

Energy dissipation is a severe issue of present-day technology. The current scenario demands for moving beyond the traditional ways of computing. In this contrast, reversible circuit offers a possible solution to this problem. For confirming the correct behavior of the reversible circuits, a proper testing technique is required to detect and also locate the faults. In this paper, we have concentrated only on generating the test set for detecting the single missing-gate fault (SMGF) and appearance fault. For this purpose, we have investigated the correlation between the two fault models, and based on that an automatic test pattern generation (ATPG) method have been proposed to extract the required test set which is capable of detecting both the faults. In this work, the process of test set generation is developed by the concept of a matrix model by applying some well-defined constraints. Finally, experimental results are provided to verify our claim. Keywords: Appearance fault, ATPG, k-CNOT based reversible circuits, matrix model, SMGF, test set Cite this Article: Mousmee Nath, Abdul Hannan Laskar, Subham Chhetry, Mousum Handique. Fault Detection Technique for SMGF and Appearance Faults in Reversible Circuits using Matrix Model. International Journal of Computer Science and Programming Language. 2020; 6(1): 13–24p.