Novel MC/DC Coverage Test Sets Generation Algorithm, and MC/DC Design Fault Detection Strength Insights

Abstract

This paper introduces Modified Condition/Decision Coverage (MC/DC), novel MC/DC coverage test sets generation algorithm named OBSRV, and MC/DC design fault detection strength. The paper presents an overview about MC/DC in terms of the MC/DC definition, MC/DC types, and the conventional MC/DC approaches. It introduces a novel algorithm, called OBSRV, for MC/DC coverage test sets generation. OBSRV resolves MC/DC controllability and observability by using principles found in the D-algorithm that is the foundation for state-of-the-art ATPG. It thereby leverages hardware test principles to advance MC/DC for software, and hardware structural coverage. The paper presents an investigation of the introduced OBSRV algorithm scalability, and complexity to prove its suitability for practical designs. The paper investigates MC/DC functional design faults detection strength, and analyzes empirical results conducted on main design fault classes in microprocessors.