Jianshi Tang, Q. Cao, D. Farmer, G. Tulevski, Shu-Jen Han
{"title":"Carbon nanotube complementary logic with low-temperature processed end-bonded metal contacts","authors":"Jianshi Tang, Q. Cao, D. Farmer, G. Tulevski, Shu-Jen Han","doi":"10.1109/IEDM.2016.7838350","DOIUrl":null,"url":null,"abstract":"CNT-based complementary logic using low-temperature processed end-boned metal contacts are demonstrated. This new form of end-bonded contact is made by carbon dissolution into metal contacts with high carbon solubility (e.g., Ni and Co), which requires only low annealing temperature (400−600 °C). As-fabricated end-bonded Ni contacts serve as robust p-type contacts to CNTs and perform better than standard Pd side-bonded contacts at scaled dimensions. In addition, stable NFETs are converted from PFETs using Al2O3 as an n-type physicochemical doping layer. CMOS inverters are further built with end-bonded contacts for both PFETs and NFETs, featuring the smallest contact size thus far for CNT inverters. These new findings could pave the way to realizing CNT-based scalable CMOS technology.","PeriodicalId":186544,"journal":{"name":"2016 IEEE International Electron Devices Meeting (IEDM)","volume":"52 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2016.7838350","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
CNT-based complementary logic using low-temperature processed end-boned metal contacts are demonstrated. This new form of end-bonded contact is made by carbon dissolution into metal contacts with high carbon solubility (e.g., Ni and Co), which requires only low annealing temperature (400−600 °C). As-fabricated end-bonded Ni contacts serve as robust p-type contacts to CNTs and perform better than standard Pd side-bonded contacts at scaled dimensions. In addition, stable NFETs are converted from PFETs using Al2O3 as an n-type physicochemical doping layer. CMOS inverters are further built with end-bonded contacts for both PFETs and NFETs, featuring the smallest contact size thus far for CNT inverters. These new findings could pave the way to realizing CNT-based scalable CMOS technology.