K. Domanski, S. Bargstadt-Franke, W. Stadler, U. Glaser, W. Bala
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引用次数: 23
Abstract
Detailed transient latch-up (TLU) analyses of external test structures show that a DC trigger does not necessarily reflect worst case conditions. Furthermore, the classical guard ring latch-up protection approach fails for transient trigger. In this contribution, design recommendations for TLU-safe designs are presented. The knowledge about the perturbation environment and an appropriate design are essential for a TLU-robust product.
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