Jerry Yu, Y. Liu, F. Cai, M. Shafiei, Gang Chen, N. Motta, W. Wlodarski, K. Kalantar-zadeh, P. Lai
{"title":"A comparison study on hydrogen sensing performance of Pt/MoO3 nanoplatelets coated with a thin layer of Ta2O5 or La2O3","authors":"Jerry Yu, Y. Liu, F. Cai, M. Shafiei, Gang Chen, N. Motta, W. Wlodarski, K. Kalantar-zadeh, P. Lai","doi":"10.1109/NEMS.2013.6559712","DOIUrl":null,"url":null,"abstract":"In this work, we investigate how hydrogen sensing performance of thermally evaporated MoO<sub>3</sub> nano-platelets can be further improved by RF sputtering a thin layer of tantalum oxide (Ta<sub>2</sub>O<sub>5</sub>) or lanthanum oxide (La<sub>2</sub>O<sub>3</sub>). We show that dissociated hydrogen atoms cause the thin film layer to be polarised, inducing a measurable potential difference greater than that as reported previously. We attribute these observations to the presence of numerous traps in the thin layer; their states allow a stronger trapping of charge at the Pt-thin film oxide interface as compared to the MoO<sub>3</sub> sensors without the coating. Under exposure to H<sub>2</sub> (10 000 ppm), the maximum change in dielectric constant is 45.6 (at 260 °C) for the Ta<sub>2</sub>O<sub>5</sub>/MoO<sub>3</sub> nanoplatelets and 31.6 (at 220 °C) for the La<sub>2</sub>O<sub>3</sub>/MoO<sub>3</sub> nano-platelets. Subsequently, the maximum sensitivity for the Ta<sub>2</sub>O<sub>5</sub>/MoO<sub>3</sub> and La<sub>2</sub>O<sub>3</sub>/MoO<sub>3</sub> based sensors is 16.8 and 7.5, respectively.","PeriodicalId":308928,"journal":{"name":"The 8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEMS.2013.6559712","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
In this work, we investigate how hydrogen sensing performance of thermally evaporated MoO3 nano-platelets can be further improved by RF sputtering a thin layer of tantalum oxide (Ta2O5) or lanthanum oxide (La2O3). We show that dissociated hydrogen atoms cause the thin film layer to be polarised, inducing a measurable potential difference greater than that as reported previously. We attribute these observations to the presence of numerous traps in the thin layer; their states allow a stronger trapping of charge at the Pt-thin film oxide interface as compared to the MoO3 sensors without the coating. Under exposure to H2 (10 000 ppm), the maximum change in dielectric constant is 45.6 (at 260 °C) for the Ta2O5/MoO3 nanoplatelets and 31.6 (at 220 °C) for the La2O3/MoO3 nano-platelets. Subsequently, the maximum sensitivity for the Ta2O5/MoO3 and La2O3/MoO3 based sensors is 16.8 and 7.5, respectively.