Comparison of a two-stage group-screening design to a standard 2k-p design for a whole-line semiconductor manufacturing simulation model

T. Ivanova, L. Malone, M. Mollaghasemi
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引用次数: 11

Abstract

The focus of the paper is on the comparison of results obtained using and not using group screening in an experimental design methodology applied to a semiconductor manufacturing simulation model. A wholeline simulation model of a semiconductor fab is built. The model includes more than 200 tools used in manufacturing 2 products with around 250 steps each. Output analysis results for the equipment utilization and queue sizes have identified the three most critical equipment groups in the fab. Seventeen input factors are set for investigation through a 2-stage group-screening experiment and a fractional factorial using all 17 factors. The result illustrates that the final models can be quite different. While group screening used with simulation can be an appealing, flexible, tractable tool for capacity analysis of a semiconductor manufacturing facility, one must be concerned with the fact that the two techniques can give different answers to the users. Additionally, researchers need to address the proper choice of significance level for group screening.
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两阶段组筛选设计与标准2k-p设计的全线半导体制造仿真模型的比较
本文的重点是在半导体制造仿真模型的实验设计方法中使用和不使用组筛选获得的结果的比较。建立了半导体晶圆厂的全线仿真模型。该模型包括200多个用于制造产品的工具,每个工具约有250个步骤。设备利用率和队列大小的输出分析结果确定了晶圆厂中三个最关键的设备组。通过两阶段的群体筛选实验和使用所有17个因素的分数因子,设置17个输入因素进行调查。结果表明,最终的模型可能有很大的不同。虽然与模拟一起使用的组筛选对于半导体制造设施的容量分析可能是一种吸引人的、灵活的、易于处理的工具,但必须考虑到这两种技术可能给用户提供不同的答案。此外,研究人员需要解决群体筛选中显著性水平的正确选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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