Terahertz Microscopy in Silicon Technology

R. Al Hadi, Y. Zhao, J. Hwang, M. Chang
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Abstract

This paper presents a terahertz microscope offering sub-wavelength resolution for imaging applications. The chip consists of a coupled terahertz Colpitts oscillators operating at 550GHz. It is implemented in a standard CMOS 65nm technology. A near-field sensing region between the oscillators is sensitive to external perturbation and results in a shift of the operating frequency. The far-field radiating frequency is extracted by an on-chip antenna and measured with an external harmonic mixer. The spatial resolution is verified with a micro-positioning stage.
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硅技术中的太赫兹显微镜
本文提出了一种太赫兹显微镜,为成像应用提供亚波长分辨率。该芯片由一个耦合的太赫兹科尔皮茨振荡器组成,工作频率为550GHz。它采用标准的CMOS 65纳米技术实现。振荡器之间的近场感应区域对外部扰动很敏感,导致工作频率的偏移。远场辐射频率由片上天线提取,外加谐波混频器测量。利用微定位平台验证了空间分辨率。
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