{"title":"Evaluation of Thick Target PIXE Analysis in the 5SDH-2 Pelletron Accelerator Facility at VNU University of Science","authors":"B. T. Hoa, N. T. Nghia, V. Phong, T. T. Anh","doi":"10.25073/2588-1124/vnumap.4623","DOIUrl":null,"url":null,"abstract":"This paper presents the evaluation of the Thick Target Particle Induced X-rays Emission (TTPIXE) technique using standard samples. The element-dependent standardization factor, H, as a function of X-ray energies is calibrated using standard sample NIST-611 and validated with two standard samples: IAEA-Soil7 and NIES-Pepperbush. The obtained results are in good agreement with the reference data. \n ","PeriodicalId":303178,"journal":{"name":"VNU Journal of Science: Mathematics - Physics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"VNU Journal of Science: Mathematics - Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.25073/2588-1124/vnumap.4623","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
This paper presents the evaluation of the Thick Target Particle Induced X-rays Emission (TTPIXE) technique using standard samples. The element-dependent standardization factor, H, as a function of X-ray energies is calibrated using standard sample NIST-611 and validated with two standard samples: IAEA-Soil7 and NIES-Pepperbush. The obtained results are in good agreement with the reference data.
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