{"title":"Validation of output voltage multiplication by using series-connected pizeoelectric elements for physical sensors","authors":"K. Kanda, Taiki Ushita, T. Fujita, K. Maenaka","doi":"10.1109/MEMSYS.2018.8346735","DOIUrl":null,"url":null,"abstract":"For the first time, it is experimentally validated that the output voltage from series-connected piezoelectric elements on MEMS structure can be multiplied without degradation. The output voltage has been degraded for conventional devices (piezoelectric voltage-output sensors) based on the series-connected piezoelectric elements because of parasitic capacitances. The elimination of the parasitic capacitance by using not Si but polymer for structural material achieves output voltage multiplication.","PeriodicalId":400754,"journal":{"name":"2018 IEEE Micro Electro Mechanical Systems (MEMS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Micro Electro Mechanical Systems (MEMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.2018.8346735","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
For the first time, it is experimentally validated that the output voltage from series-connected piezoelectric elements on MEMS structure can be multiplied without degradation. The output voltage has been degraded for conventional devices (piezoelectric voltage-output sensors) based on the series-connected piezoelectric elements because of parasitic capacitances. The elimination of the parasitic capacitance by using not Si but polymer for structural material achieves output voltage multiplication.
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