Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic

C. Metra, Daniele Rossi, M. Omaña, A. Jas, R. Galivanche
{"title":"Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic","authors":"C. Metra, Daniele Rossi, M. Omaña, A. Jas, R. Galivanche","doi":"10.1109/ETS.2008.24","DOIUrl":null,"url":null,"abstract":"We propose an on-line testing approach for the control logic of high performance microprocessors. Rather than adding information redundancy (in the form of error detecting codes), we propose to look for the information redundancy (referred to as function-inherent codes) that the microprocessor control logic may inherently have, due to its required functionality. We will show that this allows to achieve on-line testing at significant savings in terms of area and power consumption, and with lower or comparable impact on system performance and design costs, compared to alternate, traditional on-line testing approaches.","PeriodicalId":334529,"journal":{"name":"2008 13th European Test Symposium","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 13th European Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2008.24","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24

Abstract

We propose an on-line testing approach for the control logic of high performance microprocessors. Rather than adding information redundancy (in the form of error detecting codes), we propose to look for the information redundancy (referred to as function-inherent codes) that the microprocessor control logic may inherently have, due to its required functionality. We will show that this allows to achieve on-line testing at significant savings in terms of area and power consumption, and with lower or comparable impact on system performance and design costs, compared to alternate, traditional on-line testing approaches.
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功能固有代码检测:一种低成本的高性能微处理器控制逻辑在线测试新方法
我们提出了一种高性能微处理器控制逻辑的在线测试方法。而不是增加信息冗余(以错误检测代码的形式),我们建议寻找信息冗余(称为功能固有代码),微处理器控制逻辑可能固有的,由于其所需的功能。我们将展示,与替代的传统在线测试方法相比,这允许在显著节省面积和功耗的情况下实现在线测试,并且对系统性能和设计成本的影响更低或相当。
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