C. Metra, Daniele Rossi, M. Omaña, A. Jas, R. Galivanche
{"title":"Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic","authors":"C. Metra, Daniele Rossi, M. Omaña, A. Jas, R. Galivanche","doi":"10.1109/ETS.2008.24","DOIUrl":null,"url":null,"abstract":"We propose an on-line testing approach for the control logic of high performance microprocessors. Rather than adding information redundancy (in the form of error detecting codes), we propose to look for the information redundancy (referred to as function-inherent codes) that the microprocessor control logic may inherently have, due to its required functionality. We will show that this allows to achieve on-line testing at significant savings in terms of area and power consumption, and with lower or comparable impact on system performance and design costs, compared to alternate, traditional on-line testing approaches.","PeriodicalId":334529,"journal":{"name":"2008 13th European Test Symposium","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 13th European Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2008.24","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
We propose an on-line testing approach for the control logic of high performance microprocessors. Rather than adding information redundancy (in the form of error detecting codes), we propose to look for the information redundancy (referred to as function-inherent codes) that the microprocessor control logic may inherently have, due to its required functionality. We will show that this allows to achieve on-line testing at significant savings in terms of area and power consumption, and with lower or comparable impact on system performance and design costs, compared to alternate, traditional on-line testing approaches.