{"title":"Microwave and Millimeter-Wave Sensors, Systems, and Techniques for Electromagnetic Imaging and Materials Characterization","authors":"A. Randazzo, K. Donnell, Y. Lee","doi":"10.1155/2012/132136","DOIUrl":null,"url":null,"abstract":"1Applied Electromagnetics Group, Department of Naval, Electrical, Electronic, and Telecommunication Engineering, University of Genoa, 16145 Genoa, Italy 2Applied Microwave Nondestructive Testing Laboratory (amntl), Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO 65409, USA 3Department of Quality, Anritsu Company, Morgan Hill, CA 95037, USA","PeriodicalId":232251,"journal":{"name":"International Journal of Microwave Science and Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Microwave Science and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1155/2012/132136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
1Applied Electromagnetics Group, Department of Naval, Electrical, Electronic, and Telecommunication Engineering, University of Genoa, 16145 Genoa, Italy 2Applied Microwave Nondestructive Testing Laboratory (amntl), Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO 65409, USA 3Department of Quality, Anritsu Company, Morgan Hill, CA 95037, USA
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