E. Schmeichel, S. Hakimi, M. Otsuka, Geoff Sullivan
{"title":"On minimizing testing rounds for fault identification","authors":"E. Schmeichel, S. Hakimi, M. Otsuka, Geoff Sullivan","doi":"10.1109/FTCS.1988.5330","DOIUrl":null,"url":null,"abstract":"A bound is obtained for the number of rounds of testing sufficient to identify the faulty units of a system. Within a single round each unit may participate in at most one test. The authors give an adaptive algorithm which works in O(log/sub (n/t)//sup t/) rounds and uses O(n) tests. The multiplicative constants in the new bounds are small; four in both cases. This is a major improvement over previous nonadaptive and adaptive algorithm which required O(t+log n) rounds of testing and O(n+t) tests. If t>n/sup 1- epsilon /, then the algorithm runs within a constant number of rounds.<<ETX>>","PeriodicalId":171148,"journal":{"name":"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","volume":"104 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1988.5330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
A bound is obtained for the number of rounds of testing sufficient to identify the faulty units of a system. Within a single round each unit may participate in at most one test. The authors give an adaptive algorithm which works in O(log/sub (n/t)//sup t/) rounds and uses O(n) tests. The multiplicative constants in the new bounds are small; four in both cases. This is a major improvement over previous nonadaptive and adaptive algorithm which required O(t+log n) rounds of testing and O(n+t) tests. If t>n/sup 1- epsilon /, then the algorithm runs within a constant number of rounds.<>