O. Dalverny, A. Tongne, C. Ho, J. Alexis, S. Châtel, B. Faure
{"title":"Numerical simulation of interfacial delamination between SiO2 thin film and polymeric substrate","authors":"O. Dalverny, A. Tongne, C. Ho, J. Alexis, S. Châtel, B. Faure","doi":"10.1063/1.5140287","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":130539,"journal":{"name":"THE 9TH INTERNATIONAL CONFERENCE ON STRUCTURAL ANALYSIS OF ADVANCED MATERIALS - ICSAAM 2019","volume":"195 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"THE 9TH INTERNATIONAL CONFERENCE ON STRUCTURAL ANALYSIS OF ADVANCED MATERIALS - ICSAAM 2019","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.5140287","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}