T. Smedes, Greg O’Sullivan, R. Derikx, Artemio García, Bob Knoppers
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引用次数: 1
Abstract
We show that CDM testing of non-connected pins can result in over-stress or under-stress on the subsequently connected pin tested, and thus can lead to incorrect qualification. Mitigation options are discussed. We show that in particular cases CDM stressing non-connected pins may identify unique fail modes.
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