{"title":"Design with testability for a platform-based SoC design methodology","authors":"W. Ke, Khoan Truong","doi":"10.1109/APASIC.1999.824090","DOIUrl":null,"url":null,"abstract":"This paper describes a design-for-testability (DFT) methodology for an application-oriented platform-based design environment, which reuses test-ready virtual components (VCs) and integrates them using a set of predefined guidelines and practices. We focus on introducing the concept of the proposed methodology with examples for demonstrating some of the techniques and issues.","PeriodicalId":346808,"journal":{"name":"AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)","volume":"230 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APASIC.1999.824090","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
This paper describes a design-for-testability (DFT) methodology for an application-oriented platform-based design environment, which reuses test-ready virtual components (VCs) and integrates them using a set of predefined guidelines and practices. We focus on introducing the concept of the proposed methodology with examples for demonstrating some of the techniques and issues.