Post-synthesis sleep transistor insertion for leakage power optimization in clock tree networks

H. Homayoun, Shahin Golshan, E. Bozorgzadeh, A. Veidenbaum, F. Kurdahi
{"title":"Post-synthesis sleep transistor insertion for leakage power optimization in clock tree networks","authors":"H. Homayoun, Shahin Golshan, E. Bozorgzadeh, A. Veidenbaum, F. Kurdahi","doi":"10.1109/ISQED.2010.5450530","DOIUrl":null,"url":null,"abstract":"Leakage power has grown significantly and is a major challenge in SoC design. Among SoC's components, clock distribution network power accounts for a large portion of chip power. In this paper, we propose to deploy sleep transistor insertion (STI) in the clock tree in order to reduce leakage power. We characterize the effect of sleep transistor sharing and sizing on clock tree wakeup time, leakage power, and propagation delay. We use these characteristics during leakage power optimization. We present post synthesis sleep transistor insertion (PSSTI), a heuristic clustering algorithm for sleep transistor insertion with the objective of total power minimization in a given clock tree. Sleep transistor sharing and sizing are deployed in order to meet the clock skew and wakeup delay constraints. We explored the potential benefits of STI using a standard industrial VLSI-CAD flow including sleep-transistor insertion and routing after clock synthesis and place-and-route of the benchmark circuits. Our results show that clock tree leakage power is reduced by 19%–32% depending on the topology of the synthesized clock tree.","PeriodicalId":369046,"journal":{"name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","volume":"310 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 11th International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2010.5450530","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Leakage power has grown significantly and is a major challenge in SoC design. Among SoC's components, clock distribution network power accounts for a large portion of chip power. In this paper, we propose to deploy sleep transistor insertion (STI) in the clock tree in order to reduce leakage power. We characterize the effect of sleep transistor sharing and sizing on clock tree wakeup time, leakage power, and propagation delay. We use these characteristics during leakage power optimization. We present post synthesis sleep transistor insertion (PSSTI), a heuristic clustering algorithm for sleep transistor insertion with the objective of total power minimization in a given clock tree. Sleep transistor sharing and sizing are deployed in order to meet the clock skew and wakeup delay constraints. We explored the potential benefits of STI using a standard industrial VLSI-CAD flow including sleep-transistor insertion and routing after clock synthesis and place-and-route of the benchmark circuits. Our results show that clock tree leakage power is reduced by 19%–32% depending on the topology of the synthesized clock tree.
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时钟树网络中泄漏功率优化的合成后睡眠晶体管插入
泄漏功率已显著增长,是SoC设计的主要挑战。在SoC的组件中,时钟分配网络功耗占芯片功耗的很大一部分。在本文中,我们建议在时钟树中部署休眠晶体管插入(STI),以减少泄漏功率。我们描述了睡眠晶体管共享和尺寸对时钟树唤醒时间、泄漏功率和传播延迟的影响。我们在泄漏功率优化中使用这些特性。我们提出了一种基于启发式聚类算法的后合成睡眠晶体管插入算法(PSSTI),该算法的目标是在给定时钟树下实现总功耗最小化。为了满足时钟倾斜和唤醒延迟的限制,部署了睡眠晶体管共享和尺寸。我们使用标准的工业VLSI-CAD流程探索STI的潜在优势,包括时钟合成后的睡眠晶体管插入和路由以及基准电路的放置和路由。我们的结果表明,根据合成时钟树的拓扑结构,时钟树的泄漏功率降低了19%-32%。
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